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Micrograph showing intermetallic particles contained in AA3104
The phases of the particles are distinguished based on morphological identification using SEM and compositional identification using EDS, with the β-Al6(Fe,Mn) phase being more geometric (needle like) in shape and α-Alx(Fe,Mn)3Si2 phase having...
Electron Backscatter Diffraction (EBSD) map using a JEOL JSM-7001F Field Emission Scanning Electron Microscope
Microstructure of a Ti-6Al-4V alloy, processed by uniaxial compression using a Gleeble type 3800 testing machine at the following condition: 1050°C, strain of 0.7 and strain rate of 50 s-1. The sample exhibited a lamellar microstructure, composed by...
Scanning Electron Micrograph of 0.1um Pt coated on thick Cr substrate
The sample was heat-treated at 900/C for 20hours. The image depicts the formation of Pt-Cr crystals.

News

Friday, 5 June 2020
Latest Publication
Congratulations to Megan Steytler and Prof Knutsen on their recent publication

Identifying Challenges to the Commercial Viability of Direct Powder Rolled Titanium: A Systematic Review and Market Analysis

Read the full journal paper here

Publication Date:
Wed, 22 Apr 2020 - 09:30
Course Notification

Struers - Materialographic Preparation and Evaluation of Microelectronic Devices

23 June, 20:00

Difficulty preparing materialographic samples of microelectronic devices? Watch and learn as we discuss Struers’ proven solutions.

Microelectronic components present a unique challenge for materialographic preparation. Please join us as we discuss Struers’ solutions for preparing microelectronic devices.

Register now

Publication Date: